D.A. Orlov, I.N. Pavlov, Y. Otani
Moscow Power Engineering Institute (Technical University),
Tokyo A&T University

Lens chromatic aberration application for displacement measurement and light spectra analysis

A displacement measurement system using lens chromatic aberration proposed. Spectra selection parameters, accuracy and resolution were optimized. We investigated the method possibilities for object displacement measurement including two-layer structure thickness measurement and its application for particle tracks 3D - analysis.
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